Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard

NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler

Specifications

Technical Specs

Sensor Type
Silicon
Spectral Range
190-1100 nm
Slit Size
1.8 µm
Aperture Size
3.5 mm
Beam Size
7 µm - 2.3 mm
Scanhead Size
83 mm

Communication
USB 2.0
Software
NanoScan Standard
Compatible Light Sources
CW, Pulsed >25 kHz
CE Compliance
Yes
UKCA Compliance
Yes
China RoHS Compliance
Yes

Sensor Type
Silicon
Spectral Range
190-1100 nm
Slit Size
1.8 µm
Aperture Size
3.5 mm
Beam Size
7 µm - 2.3 mm
Scanhead Size
83 mm

Communication
USB 2.0
Software
NanoScan Standard
Compatible Light Sources
CW, Pulsed >25 kHz
CE Compliance
Yes
UKCA Compliance
Yes
China RoHS Compliance
Yes

Resources & Downloads

3D Product Models

2D Product Drawings

NanoScan2s Drawing(307.5 kB, PDF)
Scanning-Slit Profilers Datasheet (505.4 kB, PDF)
NanoScan2 Installation and Operation Manual(5.1 MB, PDF)

Need help?

Contact an Applications Specialist by sending us an email