Silicon Scanning Slit Beam Profiler with 1.8 µm Slit
Silicon Scanning Slit Beam Profiler with 1.8 µm Slit
The NanoScan™ 2s Si/3.5/1.8 scanning-slit profiling system accurately captures and analyzes wavelengths from 190 to 1100 nm with its Silicon detector. It features a 1.8 µm slit size suitable for small beams, near real-time data capture rates, an optional power measurement feature, and operates in CW or kHz Pulsed modes which makes it ideal for comprehensive analysis of UV, Visible, and NIR lasers.
- 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
- Power levels from 10 nW to 10W
- Silicon detector covers 190 to 1100 nm spectral range
- USB 2.0 interface
- NanoScan Standard or Professional software included See All Features
Software
NanoScan Standard
NanoScan Standard is our full-function software with a extensive set of NIST traceable ISO beam width and roundness, beam position, and M2 measurements and a customizable under interface with the ease-of-use and flexibility that customers have come to expect.
NanoScan Professional
NanoScan Professional has all of the functionality that NanoScan Standard includes. NanoScan Professional supports all of our scanning slit profilers, but includes an automation interface written in ActiveX to push data to your custom applications.
Features
Fundamentals of Laser Measurement & Beam Profiling
Is your laser's beam profile shaped correctly for your application? This video teaches the fundamentals of laser beam profiles and discusses the benefits of profiling your laser beam. Several case studies are presented showing before and after laser beam profiles.
Why Measure Your Laser Beam?
This tutorial is presented by Ophir-Spiricon sales engineers - the experts in the field of measuring lasers and in helping you get the most out of your laser beam.
Resources
Data Sheets
Scanning-Slit Profilers Datasheet (505.4 kB, PDF)
Drawings & CAD
NanoScan2s Drawing(307.5 kB, PDF)
Manuals
NanoScan2 Installation and Operation Manual(5.1 MB, PDF)
Application Notes
Catalogs
Laser Beam Profilers Catalog (7.6 MB, PDF) Laser Power & Energy Measurement and Laser Beam Analysis Catalog(27.5 MB, PDF)
Technical Notes
Finding the Center of the NanoScan How to Profile Pulsed Lasers with a Scanning Slit How Can You Tell if Your NanoScan Has a Bad Slit? Measuring Lasers Used in Photovoltaic Solar Panel Manufacturing Multiple Beam Analysis with the NanoScan Integrated Solutions Upgrading NS v2 software from Standard to Professional Measurement of Mode Field Diameters of Tapered Fibers and Waveguides for Low Loss Components Understanding Dynamic Range…The Numbers Game
Technical Articles
Measuring Pulsed Lasers with NanoScan 2s State-of-the-Art Report: Laser Beam Measuring Instruments ISO Compliance of Non-contact, Real-time Beam Analysis Imaging UV light with CCD Cameras Making High Power Measurements with Little to No Attenuation The Challenge of Focus Shift in High Power Laser Material Processing Measuring Laser Position & Pointing Stability
