The FPD-VIS-300 fast optical detector is designed for visualizing and measuring the temporal characteristics of laser beams in the spectral range from 320 to 1100 nm. It has a silicon PIN photodiode and is designed to convert optical signals into electrical signals which are then measured with third party measurement instrumentation such as oscilloscopes or spectrum analyzers for measurement. The FPD-VIS-300 has a rise time of 300 psec.
- Silicon photodiode for 320-1100 nm spectral range
- Fast 300 ps rise time
- 0.4 mm diameter active area
- Optional attenuators and fiber optic adapters See All Features
Features
Pulse Characterization Sensor Overview
Using these Ophir fast photodetectors, you can see and measure the temporal characteristics of pulsed and CW laser beams.
Fast Photodiode Spectral Responsivity
Responsivity is defined as the produced photocurrent (in Amperes) per Watt of incident radiation. It is a function of wavelength. Hence, the spectral response of the photodiode should be as high as possible at the wavelength of the laser to be measured. The spectral responsivities of the FPD series are shown in the figure. Ophir offers several fast photodiodes models with Silicon photodiodes having spectral response from 320 nm to 1100 nm, UV enhanced Silicon with extended response from 193 nm to 1100 nm, and InGaAs photodiodes which are sensitive from 900 nm to 1700 nm.
Accessories
Attenuators
FPD to IS6 Adapter
Fiber Connector Adapters
Resources
Data Sheets
Fast Photodiode Detectors (FPD) Datasheet(448.2 kB, PDF)
Drawings & CAD
FPD-VIS-300 Drawing(179.9 kB, PDF)
Manuals
FPD-IG-175/FPD-UV-3000/FPD-UV-3000-JP/FPD-VIS-300 User Manual(598.3 kB, PDF) FPD-VIS-300 Quick Reference(54.3 kB, PDF)
Catalogs
Pulse Characterization Sensors Catalog(2.6 MB, PDF) Laser Power & Energy Measurement and Laser Beam Analysis Catalog(27.5 MB, PDF)
Technical Articles
Pulsed Lasers: How to Choose the Right Fast Photodetector Ophir Power/Energy Meter Calibration Procedure and Traceability/Error Analysis Laser Measurements in Materials Processing






