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NanoScan™ Scanning Slit Laser Beam Profilers

Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels.
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NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler

NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler

  • 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
  • Power levels from 10 nW to 10W
  • Silicon detector covers 190 to 1100 nm spectral range
2 Products
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NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler PH00456 Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard
NanoScan™ 2s Si/3.5/1.8 Silicon Scanning 1.8 µm Slit Beam Profiler PH00464 Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 190-1100 nm, USB 2.0, NanoScan Pro
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NanoScan™ 2s Si/9/5 Silicon Scanning 5 µm Slit Beam Profiler

NanoScan™ 2s Si/9/5 Silicon Scanning 5 µm Slit Beam Profiler

  • 9 mm aperture for beam sizes from 20 µm to 6 mm
  • Power Levels of 10 nW to 10 W
  • Silicon detector covers 190 to 1100 nm spectral range
2 Products
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NanoScan™ 2s Si/9/5 Silicon Scanning 5 µm Slit Beam Profiler PH00457 Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 190-1100 nm, USB 2.0, NanoScan Standard
$5,034
NanoScan™ 2s Si/9/5 Silicon Scanning 5 µm Slit Beam Profiler PH00465 Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 190-1100 nm, USB 2.0, NanoScan Pro
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NanoScan™ 2s Ge/3.5/1.8 Germanium Scanning 1.8 µm Slit Beam Profiler

NanoScan™ 2s Ge/3.5/1.8 Germanium Scanning 1.8 µm Slit Beam Profiler

  • 3.5 mm aperture for beam sizes from 7 µm to 2.3 mm
  • Power levels from 10 nW to 10W
  • Germanium detector covers 700 to 1800 nm spectral range
2 Products
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NanoScan™ 2s Ge/3.5/1.8 Germanium Scanning 1.8 µm Slit Beam Profiler PH00459 Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 700-1800 nm, USB 2.0, NanoScan Standard
NanoScan™ 2s Ge/3.5/1.8 Germanium Scanning 1.8 µm Slit Beam Profiler PH00467 Scanning-Slit Beam Profiler, Ø3.5 mm, 1.8 µm Slit, 700-1800 nm, USB 2.0, NanoScan Pro
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NanoScan™ 2s Ge/9/5 Germanium Scanning 5 µm Slit Beam Profiler

NanoScan™ 2s Ge/9/5 Germanium Scanning 5 µm Slit Beam Profiler

  • 9 mm aperture for beam sizes from 20 µm to 6 mm
  • Power levels from 10 nW to 10W
  • Germanium detector covers 700 to 1800 nm spectral range
2 Products
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NanoScan™ 2s Ge/9/5 Germanium Scanning 5 µm Slit Beam Profiler PH00460 Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 700-1800 nm, USB 2.0, NanoScan Standard
NanoScan™ 2s Ge/9/5 Germanium Scanning 5 µm Slit Beam Profiler PH00468 Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 700-1800 nm, USB 2.0, NanoScan Pro
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NanoScan™ 2s Pyro/9/5 Pyroelectric Scanning 5 µm Slit Beam Profiler

NanoScan™ 2s Pyro/9/5 Pyroelectric Scanning 5 µm Slit Beam Profiler

  • 9 mm aperture for beam sizes from 20 µm to 6 mm
  • Power Levels of 5 mW to 100 W
  • Pyroelectric detector covers 190 to 100 µm spectral range
2 Products
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NanoScan™ 2s Pyro/9/5 Pyroelectric Scanning 5 µm Slit Beam Profiler PH00462 Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 190 nm to 100 μm, USB 2.0, NanoScan Standard
NanoScan™ 2s Pyro/9/5 Pyroelectric Scanning 5 µm Slit Beam Profiler PH00470 Scanning-Slit Beam Profiler, Ø9 mm, 5 µm Slit, 190 nm to 100 μm, USB 2.0, NanoScan Pro
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